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Material Type
How do you analyze a material? What are its components? Is it solid, liquid, or gas? |
| Solid |
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What is it?
Types of Materials Biomaterials Carbon Ceramics Composite materials Glass Metals Nano materials Polymers Refractory Semiconductors Thin Films Functionally Graded Materials. |
| Types of Materials |
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Is it a plastic, metal, alloy of a metal, wood, non-plastic polymer, or glass? What are its elements? What are the properties of plastic, metal, alloy of a metal, wood, non-plastic polymer, and glass? How do you analyze elements? Is it solid, liquid, or gas? What are its properties? |
| List of materials properties |
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What are its uses? How is chemical analysis of materials different from biochemical analysis of human specimens? What are the most essential elements in human blood? Exactly how are these elements measured? How do you compare and contrast chemical analysis of materials and biochemical analysis of specimens? |
Density
Here are further guidelines. |
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List of materials analysis methods: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z A Analytical ultracentrifugation - Analytical ultracentrifugation AAS - Atomic absorption spectroscopy AED - Auger electron diffraction AES - Auger electron spectroscopy AFM - Atomic force microscopy AFS - Atomic fluorescence spectroscopy APFIM - Atom probe field ion microscopy APS - Appearance potential spectroscopy ARPES - Angle resolved photoemission spectroscopy ARUPS - Angle resolved ultraviolet photoemission spectroscopy ATR - Attenuated total reflectance B BET - BET surface area measurement (BET from Brunauer, Emmett, Teller) BiFC - Bimolecular fluorescence complementation BKD - Backscatter Kikuchi diffraction, see EBSD BRET - Bioluminescence resonance energy transfer BSED - Back scattered electron diffraction, see EBSD C CAICISS - Coaxial impact collision ion scattering spectroscopy CARS - Coherent anti-Stokes Raman spectroscopy CBED - Convergent beam electron diffraction CCM - Charge collection microscopy CDI - Coherent diffraction imaging CE - Capillary electrophoresis CET - Cryo-electron tomography CL - Cathodoluminescence CLSM - Confocal laser scanning microscopy COSY - Correlation spectroscopy Cryo-EM - Cryo-electron microscopy CV - Cyclic voltammetry D DE(T)A - Dielectric thermal analysis dHvA - De Haas-van Alphen effect DIC - Differential interference contrast microscopy Dielectric spectroscopy - Dielectric spectroscopy DLS - Dynamic light scattering DLTS - Deep-level transient spectroscopy DMA - Dynamic mechanical analysis DPI - Dual polarisation interferometry DRS - Diffuse reflection spectroscopy DSC - Differential scanning calorimetry DTA - Differential thermal analysis DVS - Dynamic vapour sorption E EBIC - Electron beam induced current (and see IBIC: ion beam induced charge) EBS - Elastic (non-Rutherford) backscattering spectrometry (see RBS) EBSD - Electron backscatter diffraction ECOSY - Exclusive correlation spectroscopy ECT - Electrical capacitance tomography EDAX - Energy-dispersive analysis of x-rays EDMR - Electrically detected magnetic resonance, see ESR or EPR EDS or EDX - Energy dispersive X-ray spectroscopy EELS - Electron energy loss spectroscopy EFTEM - Energy filtered transmission electron microscopy EID - Electron induced desorption EIT and ERT - Electrical impedance tomography and Electrical resistivity tomography EL - Electroluminescence Electron crystallography - Electron crystallography ELS - Electrophoretic light scattering ENDOR - Electron nuclear double resonance, see ESR or EPR EPMA - Electron probe microanalysis EPR - Electron paramagnetic resonance spectroscopy ERD or ERDA - Elastic recoil detection or Elastic recoil detection analysis ESCA - Electron spectroscopy for chemical analysis* see XPS ESD - Electron stimulated desorption ESEM - Environmental scanning electron microscopy ESI-MS or ES-MS - Electrospray ionization mass spectrometry or Electrospray mass spectrometry ESR - Electron spin resonance spectroscopy ESTM - Electrochemical scanning tunneling microscopy EXAFS - Extended X-ray absorption fine structure EXSY - Exchange spectroscopy F FCS - Fluorescence correlation spectroscopy FCCS - Fluorescence cross-correlation spectroscopy FEM - Field emission microscopy FIB - Focused ion beam microscopy FIM-AP - Field ion microscopy–atom probe Flow birefringence - Flow birefringence Fluorescence anisotropy - Fluorescence anisotropy FLIM - Fluorescence lifetime imaging Fluorescence microscopy - Fluorescence microscopy FOSPM - Feature-oriented scanning probe microscopy FRET - Fluorescence resonance energy transfer FRS - Forward Recoil Spectrometry, a synonym of ERD FTICR or FT-MS - Fourier transform ion cyclotron resonance or Fourier transform mass spectrometry FTIR - Fourier transform infrared spectroscopy G GC-MS - Gas chromatography-mass spectrometry GDMS - Glow discharge mass spectrometry GDOS - Glow discharge optical spectroscopy GISAXS - Grazing incidence small angle X-ray scattering GIXD - Grazing incidence X-ray diffraction GIXR - Grazing incidence X-ray reflectivity GLC - Gas-liquid chromatography H HAADF - high angle annular dark-field imaging HAS - Helium atom scattering HPLC - High performance liquid chromatography HREELS - High resolution electron energy loss spectroscopy HREM - High-resolution electron microscopy HRTEM - High-resolution transmission electron microscopy I IAES - Ion induced Auger electron spectroscopy IBA - Ion beam analysis IBIC - Ion beam induced charge microscopy ICP-AES - Inductively coupled plasma atomic emission spectroscopy ICP-MS - Inductively coupled plasma mass spectrometry Immunofluorescence - Immunofluorescence ICR - Ion cyclotron resonance IETS - Inelastic electron tunneling spectroscopy IGA - Intelligent gravimetric analysis IGF - Inert gas fusion IIX - Ion induced X-ray analysis: See Particle induced X-ray emission INS - Ion neutralization spectroscopy Inelastic neutron scattering IRS - Infrared spectroscopy ISS - Ion scattering spectroscopy ITC - Isothermal titration calorimetry IVEM - Intermediate voltage electron microscopy L LALLS - Low-angle laser light scattering LC-MS - Liquid chromatography-mass spectrometry LEED - Low-energy electron diffraction LEEM - Low-energy electron microscopy LEIS - Low-energy ion scattering LIBS - Laser induced breakdown spectroscopy LOES - Laser optical emission spectroscopy LS - Light (Raman) scattering M MALDI - Matrix-assisted laser desorption/ionization MBE - Molecular beam epitaxy MEIS - Medium energy ion scattering MFM - Magnetic force microscopy MIT - Magnetic induction tomography MPM - Multiphoton fluorescence microscopy MRFM - Magnetic resonance force microscopy MRI - Magnetic resonance imaging MS - Mass spectrometry MS/MS - Tandem mass spectrometry MSGE - Mechanically Stimulated Gas Emission Mössbauer spectroscopy - Mössbauer spectroscopy MTA - Microthermal analysis Muon spin spectroscopy Magnetic susceptibility N NAA - Neutron activation analysis Nanovid microscopy - Nanovid microscopy ND - Neutron diffraction NDP - Neutron depth profiling NEXAFS - Near edge X-ray absorption fine structure NIS - Nuclear inelastic scattering/absorption NMR - Nuclear magnetic resonance spectroscopy NOESY - Nuclear Overhauser effect spectroscopy NRA - Nuclear reaction analysis NSOM - Near-field optical microscopy O OBIC - Optical beam induced current ODNMR - Optically detected magnetic resonance, see ESR or EPR OES - Optical emission spectroscopy Osmometry - Osmometry P PAS - Positron annihilation spectroscopy Photoacoustic spectroscopy - Photoacoustic spectroscopy PAT or PACT - Photoacoustic tomography or photoacoustic computed tomography PAX - Photoemission of adsorbed xenon PC or PCS - Photocurrent spectroscopy Phase contrast microscopy - Phase contrast microscopy PhD - Photoelectron diffraction PD - Photodesorption PDEIS - Potentiodynamic electrochemical impedance spectroscopy PDS - Photothermal deflection spectroscopy PED - Photoelectron diffraction PEELS - parallel electron energy loss spectroscopy PEEM - Photoemission electron microscopy (or photoelectron emission microscopy) PES - Photoelectron spectroscopy PINEM - photon-induced near-field electron microscopy PIGE - Particle (or proton) induced gamma-ray spectroscopy, see Nuclear reaction analysis PIXE - Particle (or proton) induced X-ray spectroscopy PL - Photoluminescence Porosimetry - Porosimetry Powder diffraction - Powder diffraction PTMS - Photothermal microspectroscopy PTS - Photothermal spectroscopy Q QENS - Quasielastic neutron scattering R Raman - Raman spectroscopy RAXRS - Resonant anomalous X-ray scattering RBS - Rutherford backscattering spectrometry REM - Reflection electron microscopy RDS - Reflectance Difference Spectroscopy RHEED - Reflection high energy electron diffraction RIMS - Resonance ionization mass spectrometry RIXS - Resonant inelastic X-ray scattering RR spectroscopy - Resonance Raman spectroscopy S SAD - Selected area diffraction SAED - Selected area electron diffraction SAM - Scanning Auger microscopy SANS - Small angle neutron scattering SAXS - Small angle X-ray scattering SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation SCEM - Scanning confocal electron microscopy SE - Spectroscopic ellipsometry SEC - Size exclusion chromatography SEIRA - Surface enhanced infrared absorption spectroscopy SEM - Scanning electron microscopy SERS - Surface enhanced Raman spectroscopy SERRS - Surface enhanced resonance Raman spectroscopy SEXAFS - Surface extended X-ray absorption fine structure SICM - Scanning ion-conductance microscopy SIL - Solid immersion lens SIM - Solid immersion mirror SIMS - Secondary ion mass spectrometry SNMS - Sputtered neutral species mass spectrometry SNOM - Scanning near-field optical microscopy SPECT - Single photon emission computed tomography SPM - Scanning probe microscopy SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry SSNMR - Solid-state nuclear magnetic resonance Stark spectroscopy - Stark spectroscopy STED - Stimulated Emission Depletion microscopy STEM - Scanning transmission electron microscopy STM - Scanning tunneling microscopy STS - Scanning tunneling spectroscopy SXRD - Surface X-ray Diffraction (SXRD) T TAT or TACT - Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography - PAT) TEM - transmission electron microscope/microscopy TGA - Thermogravimetric analysis TIKA - Transmitting ion kinetic analysis TIMS - Thermal ionization mass spectrometry TIRFM - Total internal reflection fluorescence microscopy TLS - Photothermal lens spectroscopy, a type of Photothermal spectroscopy TMA - Thermomechanical analysis TOF-MS - Time-of-flight mass spectrometry Two-photon excitation microscopy - Two-photon excitation microscopy TXRF - Total reflection X-ray fluorescence analysis U Ultrasound attenuation spectroscopy - Ultrasound attenuation spectroscopy Ultrasonic testing - Ultrasonic testing UPS - UV-photoelectron spectroscopy USANS - Ultra small-angle neutron scattering USAXS - Ultra small-angle X-ray scattering UV-Vis - Ultraviolet–visible spectroscopy V VEDIC - Video-enhanced differential interference contrast microscopy Voltammetry - Voltammetry W WAXS - Wide angle X-ray scattering WDX or WDS - Wavelength dispersive X-ray spectroscopy X XAES - X-ray induced Auger electron spectroscopy XANES - XANES, synonymous with NEXAFS (Near edge X-ray absorption fine structure) XAS - X-ray absorption spectroscopy X-CTR - X-ray crystal truncation rod scattering X-ray crystallography - X-ray crystallography XDS - X-ray diffuse scattering XPEEM - X-ray photoelectron emission microscopy XPS - X-ray photoelectron spectroscopy XRD - X-ray diffraction XRES - X-ray resonant exchange scattering XRF - X-ray fluorescence analysis XRR - X-ray reflectivity XRS - X-ray Raman scattering XSW - X-ray standing wave technique |